Park NX 20 Ultra Fast Atomik Kuvvet Mikroskobu

Park NX 20 Ultra Fast Atomik Kuvvet Mikroskobu, tamamen otomatik olarak çalışabilen, yüksek çözünürlüklü 6” – 12” örnekler için uygun Atomik Kuvvet Mikroskobu’ dur. Ayrıca sistemin sahip oluğu tarayıcı üniteleri Atomic Force Microscope olarak ultra hızlı görüntü alma imkanı sağlar.

Park NX 20 Ultra Fast Atomik Kuvvet Mikroskobu Özellikleri

Yüksek çözünürlükte 3D görüntü kalitesi

1. Ultra hızlı tarayıcı ayrıca,
2. Tamamen programlanabilir Smart Scan yazılım ayrıca,
3. Otomatik tarama modu ayrıca,
4. Motorize programlanabilir 6” – 12” XY tablası ayrıca,
5. Opsiyonel Modlar

Park NX 20 Ultra Fast Chemical Properties

1. Chemical Force Microscopy with Functionalized Tip
2. Electrochemical Microscopy (EC-STM and EC-AFM)

Dielectric/Piezoelectric Properties

1. Electric Force Microscopy (EFM)
2. Dynamic Contact EFM (DC-EFM)
3. Piezoelectric Force Microscopy (PFM)
4. PFM with High Voltage

Force Measurement
• Force Distance (F-D) Spectroscopy
• Force Volume Imaging
• Spring Constant Calibration by
Thermal Method
Electrical Properties
• Conductive AFM ayrıca,
• I-V Spectroscopy ayrıca,
• Scanning Kelvin Probe Microscopy (SKPM/KPM) ayrıca,
• SKPM with High Voltage ayrıca,
• Scanning Capacitance Microscopy (SCM) ayrıca,
• Scanning Spreading-Resistance Microscopy (SSRM) ayrıca,
• Scanning Tunneling Microscopy (STM) ayrıca,
• Scanning Tunneling Spectroscopy (STS) ayrıca,
• Time-Resolved Photo Current Mapping (Tr-PCM)
Magnetic Properties
• Magnetic Force Microscopy (MFM)ayrıca,
• Tunable MFM
Mechanical Properties
• Force Modulation Microscopy (FMM)ayrıca,
• Nanoindentation ayrıca,
• Nanolithography ayrıca,
• Nanolithography with High Voltage ayrıca,
• Nanomanipulation ayrıca,
• Piezoelectric Force Microscopy (PFM)
Optical Properties
• Tip-Enhanced Raman Spectroscopy (TERS) ayrıca,
• Time-Resolved Photo Current Mapping (Tr-PCM) ayrıca,
Thermal Properties
• Scanning Thermal Microscopy (SThM)