Ürünler

Park System XE7 Afm
14 Ocak 2016
Park NX 10 Ultra Fast Afm
14 Ocak 2016
Show all

Park XE 15 Afm

Açıklama

-Yüksek çözünürlükte 3D görüntü

-150mm x 150mm motorize örnek tablası

-Programlanabilir tarama alanı

-Çoklu örnek tarama imkanı

-1500 x optik zoom

-Opsiyonel Modlar

Chemical Properties

  • Chemical Force Microscopy with Functionalized Tip
  • Electrochemical Microscopy (EC-STM and EC-AFM)

Dielectric/Piezoelectric Properties

  • Electric Force Microscopy (EFM)
  • Dynamic Contact EFM (DC-EFM)
  • Piezoelectric Force Microscopy (PFM)
  • PFM with High Voltage

Force Measurement

  • Force Distance (F-D) Spectroscopy
  • Force Volume Imaging
  • Spring Constant Calibration by Thermal Method

Electrical Properties

  • Conductive AFM
  • I-V Spectroscopy
  • Scanning Kelvin Probe Microscopy (SKPM/KPM)
  • SKPM with High Voltage
  • Scanning Capacitance Microscopy (SCM)
  • Scanning Spreading-Resistance Microscopy (SSRM)
  • Scanning Tunneling Microscopy (STM)
  • Scanning Tunneling Spectroscopy (STS)
  • Time-Resolved Photo Current Mapping (Tr-PCM)

Magnetic Properties

  • Magnetic Force Microscopy (MFM)

Mechanical Properties

  • Force Modulation Microscopy (FMM)
  • Nanoindentation
  • Nanolithography
  • Nanolithography with High Voltage
  • Nanomanipulation
  • Piezoresponse Force Microscopy (PFM)

Optical Properties

  • Tip-Enhanced Raman Spectroscopy (TERS)
  • Time-Resolved Photo Current Mapping (Tr-PCM)

Thermal Properties

  • Scanning Thermal Microscopy (SThM)