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Park XE 15 Afm
14 Ocak 2016
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Park System XE7 Afm

Açıklama

Yüksek çözünürlükte 3D görüntü
-Kolay kullanım
-1500 x Optic + Video Kamera
-Bağımsız XY tarayıcı
-Opsiyonel Modlar
Chemical Properties
• Chemical Force Microscopy with Functionalized Tip
• Electrochemical Microscopy (EC-STM and EC-AFM)
Dielectric/Piezoelectric Properties
• Electric Force Microscopy (EFM)
•Dynamic Contact EFM (DC-EFM)
•Piezoelectric Force Microscopy (PFM)
•PFM with High Voltage
Force Measurement
• Force Distance (F-D) Spectroscopy
• Force Volume Imaging
• Spring Constant Calibration by Thermal Method
Electrical Properties
• Conductive AFM
• I-V Spectroscopy
• Scanning Kelvin Probe Microscopy (SKPM/KPM)
• SKPM with High Voltage
• Scanning Capacitance Microscopy (SCM)
• Scanning Spreading-Resistance Microscopy (SSRM)
• Scanning Tunneling Microscopy (STM)
• Scanning Tunneling Spectroscopy (STS)
• Time-Resolved Photo Current Mapping (Tr-PCM)
Magnetic Properties
• Magnetic Force Microscopy (MFM)
• Tunable MFM
Mechanical Properties
• Force Modulation Microscopy (FMM)
• Nanoindentation
• Nanolithography
• Nanolithography with High Voltage
• Nanomanipulation
• Piezoresponse Force Microscopy (PFM)
Optical Properties
• Tip-Enhanced Raman Spectroscopy (TERS)
• Time-Resolved Photo Current Mapping (Tr-PCM)
Thermal Properties
• Scanning Thermal Microscopy (SThM)